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In the TMA scan example (Fig 125), the material has a z-axis CTE(a1) of 65ppm/K and a z-axis CTE(a2) of 150 ppm/K The CTE in x and y direction can also be measured by TMA, although care must be taken during the preparation of the sample to avoid any influence of reinforcement material on the TMA probe The results are strongly dependent on the properties of the reinforcement fabric Another method to determine the x- and y-axis CTE of laminate materials employs strain gauges This method is described in IPC-TM-650, method 24412 Many details need to be taken into consideration when making use of this method The strain gauges need to be calibrated for the specific temperature range and the adhesive used to attach them needs to be stable over the whole range Special care needs to be taken during specimen preparation and gauge attachment.

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It is recommended to run one heat cycle prior to the actual measurement to remove any residual stresses More details can be found in IPC-TM-650 12523 Thermal Resistance The thermal resistance of laminate materials is one of the key properties, especially in light of the lead-free processing conditions It is the most important indicator of the performance of printed circuit boards during assembly operations As already mentioned in the Sec 121, most printed circuit boards will be required to withstand at least five reflow cycles with a peak temperature in the range of 260 C, but that number may increase to six and above for more complex assemblies During exposure to these process temperatures, the laminate cannot delaminate or begin decomposition.

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Another important factor that can be assessed with thermal resistance tests is the performance of the laminate in printed circuit board applications that expose the board to high-operating temperatures Several different test methods should be considered when qualifying laminates 125231 Solder Dip Resistance The test method is described in IPC-TM-650, method 2423The original purpose of this test technique was to assess the solderability of the laminate surface, but today it is often used to assess the ability of laminate materials to withstand the temperatures in a molten solder bath It is important to note that the original IPC methodology has not been revised in a long time and the current version may not reflect the actual temperature requirements of lead-free processing.

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The authors still feel that this method is a very good assessment and differentiation technique for laminate materials and recommend that either solder pot temperatures or exposure times are increased if the laminates are intended for use in lead-free assembly processes Performance factors that are being considered are resistance to softening, loss of surface resin, scorching, delamination, blistering, and measling The material will be tested in three different surface configurations: (1) a surface upon which no metal cladding was ever applied (if possible), (2) a surface with the metal cladding removed by standard etching processes, and (3) a surface with metal cladding as received The sample size for all specimen is 1 1/4 in 1 1/4 in thickness and three samples are required for each surface configuration All samples are tested using the same procedure Preclean the samples by immersing them for 15 sec.

in 10 percent hydrochloric acid (HCl) (by volume) and then rinse in water The HCl should be at a temperature of 60 C (140 F) Dry the specimen quickly to avoid excess oxidation of the sample Dip the sample into a flux agent and allow draining for 60 sec before proceeding with the solder dip Stir and then skim the surface of the molten solder with a clean stainless steel paddle to ensure that the solder.

TABLE 26.3 Cleaning Solutions Used to Remove Various Contaminants Cleaning technique Abrasion Plasma Chemical solutions (aqueous etchants) Chemical solutions (nonaqueous) Thermal Process chemistry Pumice, Al oxide CF4/O2, O2/H2O H2SO4, HCl, etc. Alcohols, etc. N2 Contaminant removed All Organic Inorganic Organic H2O

Source: Adapted from Introduction to Microlithography, 1st ed., L. F. Thompson and M. J. Bowden, American Chemical Society Symposium Series 219, Washington, D.C., 1983, p. 184.

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